Testability of VLSI Lecture 6B: Introduction to Automatic Test Pattern Generation
992 بار بازدید -
11 ماه پیش
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Testing, Thermal Imaging, Functional Versus
Testing, Thermal Imaging, Functional Versus Structural Testing, Logic verification of a 32-bit ripple-carry adder, ATPG, Exhaustive, Random, Deterministic ATPG, Symbolic – Boolean Difference, Solved Examples of Boolean Difference, Problems and Solutions Boolean Difference, ATPG Algebra, D algebra Single Fault, Problems and Solutions D algebra, Solved Examples of D algebra, Static Glitch Example, Redundancy Definition for Testing Purposes.
11 ماه پیش
در تاریخ 1402/06/05 منتشر شده
است.
992
بـار بازدید شده