Nano Technology Session 2 (SEM, TEM, AFM, Applications of Nanotechnology) noise reduced

This is a 2nd session on NanoTechnology. In this session, Tools for characterization of Nanoparticles: Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Atomic Force Microscope (AFM) are introduced. Applications of nanotechnology are discussed at the end. Flow of discussion is as per First year Engineering Mumbai University syllabus for Engineering Physics. This session was created by considering the current scenario of lock down due to which we are not able to go the colleges. Hope that students will find it useful..

Notes on this topic are available here : https://drive.google.com/file/d/1Dm9E...

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• #engineering_physics
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