Scanning Electron Microscope: Pt 1 of 6

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 1 of a 6-part series, and gives a tour of the device, and describes how to prepare a sample.

More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/me...

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