Hamamatsu Photo emission microscope system PHEMOS-X

Hamamatsu reveals the innovative platform of the photo emission microscope, PHEMOS-X.
PHEMOS-X enhances the reliability of semiconductor and electronic devices by making
the defect localization and the failure analysis done more quickly and accurately than ever before.

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Inquiry:
(English) https://www.hamamatsu.com/all/en/supp...
(Japanese) https://www.hamamatsu.com/jp/ja/suppo...

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