Testability of VLSI Lecture 2: Fault Modelling

Defects, Errors, and Faults, Fabrication Faults, Fault Models, Functional Versus Structural Testing, Common Structural Fault Models, Single stuck-at faults, Multiple Stuck-at faults, Transistor open and short faults, Bridging Faults, Delay faults (transition, path). Cell Aware Fault Model