Atomic Force Microscopy - JPK NanoWizard® AFM - tip scanner vs. sample scanner

Using the example of the NanoWizard®II atomic force microscope (AFM), this animation illustrates that only a tip-scanning AFM such as the NanoWizard®I, II or 3 from JPK Instruments truly enables simultaneous AFM and optical microscopy measurements.

• #فناوری_و_رایانه
• #atomic
• #afm
• #bioafm